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1.
Markov Random Field Modeling in Image Analysis
Full text!
Author:
Li, S. Z.; Singh, S.
Publisher:
Springer London 2009
Format:
e-book
2.
Semiconductor Physical Electronics
Full text!
Author:
Li, Sheng S.
Publisher:
Springer New York 2006
Format:
e-book
3.
Handbook of Face Recognition
Full text!
Author:
Li, Stan Z.; Jain, Anil K.; Li, S. Z.
Publisher:
Springer New York 2005
Format:
e-book
4.
Encyclopedia of Biometrics
Full text!
Author:
Li, Stan Z.; Jain, Anil; Li, S. Z.; Jain, Anil K.
Publisher:
Springer US 2009
Format:
e-book
5.
Handbook of Remote Biometrics
Full text!
Author:
Singh, Sameer; Chellappa, Rama; Li, S. Z.; Tistarelli, Massimo; Li, Stan Z.
Publisher:
Springer London 2009
Format:
e-book
6.
Advances in Biometric Person Authentication
Full text!
Author:
Li, Stan Z.; Feng, Guocan; Kanade, Takeo; Lai, Jianhuang; Li, S. Z.; Tan, Tieniu; Wang, Yunhong
Publisher:
Springer Berlin / Heidelberg 2005
Format:
e-book
7.
Handbook of Biometric Anti-Spoofing
Full text!
Author:
Marcel, Sébastien; Alegre, Federico; Li, S. Z.; Marcel, Sâebastien; Nixon, Mark S.; Singh, Sameer; Li, Stan Z.
Publisher:
Springer London 2014
Format:
e-book
8.
Theory and Applications of Models of Computation
Full text!
Author:
T. V. Gopal, Manindra Agrawal, Angsheng Li, S. Barry Cooper; Agrawal, Manindra; Cooper, S. Barry; Li, Angsheng
Publisher:
Springer International Publishing 2014
Format:
e-book
9.
Ethnic Skin and Hair and Other Cultural Considerations
Full text!
Author:
Becky S. Li; Maibach, Howard I.
Publisher:
Springer International Publishing 2021
Format:
e-book
10.
Advances in Biometric Person Authentication
Full text!
Author:
Kanade, Takeo; Li, S. Z.; Li, Stan Z.; Pankanti, Sharath; Sun, Zhenan; Tan, Tieniu; Zhang, David; Chollet, Gérard; Zhang, David Y.
Publisher:
Springer Berlin / Heidelberg 2005
Format:
e-book
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