Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

MLA

Franco, Jacopo, Ben Kaczer, and Guido Groeseneken. Reliability of High Mobility Sige Channel Mosfets for Future Cmos Applications. Springer Netherlands, 2014.

APA

Franco, J., Kaczer, B., & Groeseneken, G. (2014). Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications. Springer Netherlands.

Chicago

Franco, Jacopo, Ben Kaczer, and Guido Groeseneken. Reliability of High Mobility Sige Channel Mosfets for Future CMOS Applications. : Springer Netherlands, 2014.