New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices

MLA

Zalevsky, Zeev, Eran Gur, and Pavel Livshits. New Approaches to Image Processing Based Failure Analysis of Nano-scale Ulsi Devices. William Andrew Publishing, 2014.

APA

Zalevsky, Z., Gur, E., & Livshits, P. (2014). New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices. William Andrew Publishing.

Chicago

Zalevsky, Zeev, Eran Gur, and Pavel Livshits. New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices. : William Andrew Publishing, 2014.