MLA

Ito, Kodo, and Toshio Nakagawa. Optimal Inspection Models with Their Applications. Cham: Springer International Publishing AG, 2023.

APA

Ito, K., & Nakagawa, T. (2023). Optimal Inspection Models with Their Applications. Cham: Springer International Publishing AG.

Chicago

Ito, Kodo., and Toshio Nakagawa. Optimal Inspection Models with Their Applications. Cham: Springer International Publishing AG, 2023.