Built-In Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design : A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

MLA

Li, Xiaowei, Cheng Liu, and Guihai Yan. Built-in Fault-tolerant Computing Paradigm for Resilient Large-scale Chip Design : A Self-test, Self-diagnosis, and Self-repair-based Approach. Singapore: Springer, 2023.

APA

Li, X., Liu, C., & Yan, G. (2023). Built-In Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design : A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach. Singapore: Springer.

Chicago

Li, Xiaowei., Cheng Liu, and Guihai Yan. Built-In Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design : A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach. Singapore: Springer, 2023.