Fundamentals of Electromigration-Aware Integrated Circuit Design

MLA

Lienig, Jens, Susann Rothe, and Matthias Thiele. Fundamentals of Electromigration-aware Integrated Circuit Design. Cham: Springer, 2025.

APA

Lienig, J., Rothe, S., & Thiele, M. (2025). Fundamentals of Electromigration-Aware Integrated Circuit Design. Cham: Springer.

Chicago

Lienig, Jens., Susann Rothe, and Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. Cham: Springer, 2025.