Long-Term Reliability of Nanometer VLSI Systems

MLA

Tan, et al. Long-term Reliability of Nanometer Vlsi Systems. Springer International Publishing, 2019.

APA

Tan, T., Kiamehr, S., Kim, T., Sun, Z., Tahoori, M., & Wang, S. (2019). Long-Term Reliability of Nanometer VLSI Systems. Springer International Publishing.

Chicago

Tan, Saman Kiamehr, Taeyoung Kim, Zeyu Sun, Mehdi Tahoori, and Shengcheng Wang. Long-Term Reliability of Nanometer VLSI Systems. : Springer International Publishing, 2019.