MARC Record

Leader
920
  
  
a| ebook
008 250703s----------------------000---eng-d
001 2670000000174921
009 ebk03
090
  
  
a| 2670000000174921
245
  
  
a| Characterization of Microstructures by Analytical Electron Microscopy (AEM)
260
  
  
b| Higher Education Press, Beijing and Springer-Verlag Berlin Heidelberg c| 2012
020
  
  
a| 3-642-20118-0
020
  
  
a| 9786613702708
020
  
  
a| 3-642-20119-9
020
  
  
a| 1-280-79231-0
100
2
  
a| Rong, Yonghua.
856
  
  
u| http://sfxit.ugent.be/sfx_howest?url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&rfr_id=info:sid/sfxit.com:opac_856&url_ctx_fmt=info:ofi/fmt:kev:mtx:ctx&sfx.ignore_date_threshold=1&rft.object_id=2670000000174921&svc_val_fmt=info:ofi/fmt:kev:mtx:sch_svc&svc.fulltext=yes&
866
  
  
s| 3860000000000675 t| 3860000000000883 x| SpringerLink Books - AutoHoldings:Full Text z| 3850000001309542