Librarian View
LEADER 00000nam-a2200000z--4500
920
a| ebook
008
250703s----------------------000---eng-d
001
3400000000086400
009
ebk03
090
a| 3400000000086400
245
a| Design, Analysis and Test of Logic Circuits Under Uncertainty
260
b| Springer Netherlands
c| 2013
020
a| 90-481-9643-4
020
a| 94-007-9798-2
020
a| 90-481-9644-2
020
a| 1-283-64077-5
100
1
a| Krishnaswamy, Smita
700
1
a| Markov, Igor L.
700
2
a| Hayes, John P.
856
u| http://sfxit.ugent.be/sfx_howest?url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&rfr_id=info:sid/sfxit.com:opac_856&url_ctx_fmt=info:ofi/fmt:kev:mtx:ctx&sfx.ignore_date_threshold=1&rft.object_id=3400000000086400&svc_val_fmt=info:ofi/fmt:kev:mtx:sch_svc&svc.fulltext=yes&
866
s| 3860000000000675
t| 3860000000000883
x| SpringerLink Books - AutoHoldings:Full Text
z| 3850000001329227