MARC Record
Leader
920
a| ebook
008
250703s----------------------000---eng-d
001
3710000000115609
009
ebk03
090
a| 3710000000115609
245
a| Fundamental principles of engineering nanometrology
260
b| William Andrew Publishing
c| 2014
020
a| 1-4557-7753-6
020
a| 1-4557-7750-1
100
1
a| Leach, R. K.
856
u| http://sfxit.ugent.be/sfx_howest?url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&rfr_id=info:sid/sfxit.com:opac_856&url_ctx_fmt=info:ofi/fmt:kev:mtx:ctx&sfx.ignore_date_threshold=1&rft.object_id=3710000000115609&svc_val_fmt=info:ofi/fmt:kev:mtx:sch_svc&svc.fulltext=yes&
866
s| 3850000000000461
t| 3850000000000737
x| Elsevier ScienceDirect eBooks Freedom Collection 2016:Full Text
z| 3850000001221823
866
s| 3850000000000456
t| 3850000000000732
x| Elsevier ScienceDirect eBooks Freedom Collection 2017:Full Text
z| 3850000001214042