Field Emission Scanning Electron Microscopy

Full text!
Type:
e-book
Titel:
Field Emission Scanning Electron Microscopy
Auteur:
Brodusch, Nicolas; Demers, Hendrix; Gauvin, Raynald
Taal:
Engels
Uitgever:
Springer Singapore 2018
ISBN:
981-10-4432-5
981-10-4433-3
Permalink:
http://bibtest.howest.be/catalog/ebk03:4100000000587606