VLSI Design and Test for Systems Dependability

Full text!
Type:
e-book
Titel:
VLSI Design and Test for Systems Dependability
Auteur:
Asai, Shojiro
Taal:
Engels
Uitgever:
Springer Japan 2019
ISBN:
4-431-56592-2
4-431-56594-9
Permalink:
http://bibtest.howest.be/catalog/ebk03:4100000005249364