MARC Record
Leader
920
a| periodical
008
250703s----------------------000---eng-d
010
a| ---95657656-
001
954925565710
009
ejn03
090
a| 954925565710
210
a| J ELEC TEST
210
a| J ELECTRON TEST
210
a| J ELECTRON TEST THEORY APPL
210
a| J ELECTRON TEST THEORY APPL JETTA
210
a| J ELECTRON TESTING THEORY APP
210
a| J. ELECTRON. TEST.-THEORY APPL
210
a| JOURNAL OF ELECTRONIC TESTING
210
a| JOURNAL OF ELECTRONIC TESTING THEORY AND APPLICATIONS
245
a| Journal of Electronic Testing-Theory and Applications
260
a| UNITED STATES
b| Hybrid
022
a| 0923-8174
776
x| 1573-0727
856
u| http://sfxit.ugent.be/sfx_howest?url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&rfr_id=info:sid/sfxit.com:opac_856&url_ctx_fmt=info:ofi/fmt:kev:mtx:ctx&sfx.ignore_date_threshold=1&rft.object_id=954925565710&svc_val_fmt=info:ofi/fmt:kev:mtx:sch_svc&svc.fulltext=yes&
866
a| Available from 1997/02/01 volume: 10 issue: 1.
s| 3860000000000676
t| 3860000000000884
x| SpringerLink Journals - AutoHoldings:Full Text
z| 3850000001275205
650
a| Engineering
x| Electrical Engineering
650
a| Engineering
x| Electronics