MARC Record
Leader
920
a| periodical
008
250703s----------------------000---eng-d
010
a| --2001211852
001
991042727105598
009
ejn03
090
a| 991042727105598
210
a| ELECTRON DEVICE FAIL ANAL
245
a| Electronic Device Failure Analysis
260
a| Materials Park, OH
b| ASM International
022
a| 1537-0755
856
u| http://sfxit.ugent.be/sfx_howest?url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&rfr_id=info:sid/sfxit.com:opac_856&url_ctx_fmt=info:ofi/fmt:kev:mtx:ctx&sfx.ignore_date_threshold=1&rft.object_id=991042727105598&svc_val_fmt=info:ofi/fmt:kev:mtx:sch_svc&svc.fulltext=yes&
866
a| Available from 2008/05/01.
s| 4340000000000227
t| 4340000000000211
x| EBSCOhost Academic Search Ultimate:Full Text
z| 4340000000772381
650
a| Engineering
x| Electrical Engineering