MARC Record
Leader
001
001927387
003
BE-GnUNI
005
20230808104939.0
008
070323s2006 ||||||||||||||||| ||eng||
020
a| 0471972924
040
a| Howest
041
0
a| eng
084
a| 640.4
2| vsiso
100
1
a| Vickerman, John C.,
d| ....-
0| (viaf)
245
1
0
a| Surface analysis :
b| the principal techniques /
c| John C. Vickerman.
250
a| Reprinted ed.
260
a| Chichester :
b| Wiley,
c| 2006.
300
a| XVI, 457 p. :
b| ill.
520
a| Vacuum Technology for Applied Surface Science (R Wilson) Electron Spectroscopy for Chemical Analysis (B Ratner & D Castner) Auger Electron Spectroscopy (H Mathieu) Secondary Ion Mass Spectroscopy-the Surface Mass Spectrometry (J Vickerman & A Swift) Low-Energy Ion Scattering and Rutherford Backscattering (E Taglauer) Vibrational Spectroscopy from Surfaces (M Pemble) Surface Structure Determination by Interference Techniques (W Flavell) Scanning Tunnelling Microscopy and Atomic Force Microscopy (G Leggett) Index.
650
4
a| Grensvlakchemie.
650
4
a| Materiaalonderzoek.
650
4
a| Meettechnieken.
650
4
a| Oppervlakte-analyse.
852
4
b| HWPNT
c| PENTA
j| PENTA.640.4 VICK 06
p| 3009952
920
a| book