Zoeken

U zocht naar: Auteur Sclaroff, Stan Filter Auteur: Sclaroff, Stan weghalen Fulltext online Filter Fulltext: online weghalen
« Vorige | 1 - 10 van 14 |
Aantal zoekresultaten per pagina

Zoekresultaten

1. Visual Saliency: From Pixel-Level to Object-Level Analysis
thumbnail
Full text!
Auteur:
Zhang; Malmberg, Filip; Sclaroff, Stan
Uitgever:
Springer International Publishing 2019
Type:
e-book
2. Image Analysis and Processing. ICIAP 2022 Workshops : ICIAP International Workshops, Lecce, Italy, May 23-27, 2022, Revised Selected Papers, Part II
thumbnail
Full text!
Auteur:
Mazzeo, Pier Luigi.; Distante, Cosimo; Frontoni, Emanuele; Sclaroff, Stan
Uitgever:
Cham Springer International Publishing AG 2022
Type:
e-book
3. Image Analysis and Processing. ICIAP 2022 Workshops : ICIAP International Workshops, Lecce, Italy, May 23-27, 2022, Revised Selected Papers, Part I
thumbnail
Full text!
Auteur:
Mazzeo, Pier Luigi.; Distante, Cosimo; Frontoni, Emanuele; Sclaroff, Stan
Uitgever:
Cham Springer International Publishing AG 2022
Type:
e-book
4. Image Analysis and Processing - ICIAP 2022 : 21st International Conference, Lecce, Italy, May 23-27, 2022, Proceedings, Part I
thumbnail
Full text!
Auteur:
Sclaroff, Stan.; Distante, Cosimo; Farinella, Giovanni M.; Leo, Marco; Tombari, Federico
Uitgever:
Cham Springer International Publishing AG 2022
Type:
e-book
5. Image Analysis and Processing - ICIAP 2022 : 21st International Conference, Lecce, Italy, May 23-27, 2022, Proceedings, Part III
thumbnail
Full text!
Auteur:
Sclaroff, Stan.; Distante, Cosimo; Farinella, Giovanni M.; Leo, Marco; Tombari, Federico
Uitgever:
Cham Springer International Publishing AG 2022
Type:
e-book
6. Image Analysis and Processing - ICIAP 2022 : 21st International Conference, Lecce, Italy, May 23-27, 2022, Proceedings, Part II
thumbnail
Full text!
Auteur:
Sclaroff, Stan.; Distante, Cosimo; Farinella, Giovanni M.; Leo, Marco; Tombari, Federico
Uitgever:
Cham Springer International Publishing AG 2022
Type:
e-book
7. Pattern Recognition. ICPR International Workshops and Challenges
thumbnail
Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
8. Pattern Recognition. ICPR International Workshops and Challenges
thumbnail
Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
9. Pattern Recognition. ICPR International Workshops and Challenges
thumbnail
Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
10. Pattern Recognition. ICPR International Workshops and Challenges
thumbnail
Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book