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1. Pattern Recognition. ICPR International Workshops and Challenges
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Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
2. Pattern Recognition. ICPR International Workshops and Challenges
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Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
3. Pattern Recognition. ICPR International Workshops and Challenges
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Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
4. Pattern Recognition. ICPR International Workshops and Challenges
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Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
5. Pattern Recognition. ICPR International Workshops and Challenges
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Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
6. Pattern Recognition. ICPR International Workshops and Challenges
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Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
7. Pattern Recognition. ICPR International Workshops and Challenges
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Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
8. Pattern Recognition. ICPR International Workshops and Challenges
thumbnail
Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book