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1. Low-Power High-Resolution Analog to Digital Converters
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Author:
Zjajo, Amir; Pineda de Gyvez, José; Pineda de Gyvez, José; Gyvez, Jose Pineda de
Publisher:
Springer Netherlands 2011
Format:
e-book
2. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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Author:
Sachdev, Manoj; Pineda de Gyvez, José
Publisher:
Springer US 2007
Format:
e-book