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Sclaroff, Stan.
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1.
Visual Saliency: From Pixel-Level to Object-Level Analysis
Full text!
Author:
Zhang; Malmberg, Filip; Sclaroff, Stan
Publisher:
Springer International Publishing 2019
Format:
e-book
2.
Image Analysis and Processing. ICIAP 2022 Workshops : ICIAP International Workshops, Lecce, Italy, May 23-27, 2022, Revised Selected Papers, Part II
Full text!
Author:
Mazzeo, Pier Luigi.; Distante, Cosimo; Frontoni, Emanuele; Sclaroff, Stan
Publisher:
Cham Springer International Publishing AG 2022
Format:
e-book
3.
Image Analysis and Processing. ICIAP 2022 Workshops : ICIAP International Workshops, Lecce, Italy, May 23-27, 2022, Revised Selected Papers, Part I
Full text!
Author:
Mazzeo, Pier Luigi.; Distante, Cosimo; Frontoni, Emanuele; Sclaroff, Stan
Publisher:
Cham Springer International Publishing AG 2022
Format:
e-book
4.
Image Analysis and Processing - ICIAP 2022 : 21st International Conference, Lecce, Italy, May 23-27, 2022, Proceedings, Part I
Full text!
Author:
Sclaroff, Stan.; Distante, Cosimo; Farinella, Giovanni M.; Leo, Marco; Tombari, Federico
Publisher:
Cham Springer International Publishing AG 2022
Format:
e-book
5.
Image Analysis and Processing - ICIAP 2022 : 21st International Conference, Lecce, Italy, May 23-27, 2022, Proceedings, Part III
Full text!
Author:
Sclaroff, Stan.; Distante, Cosimo; Farinella, Giovanni M.; Leo, Marco; Tombari, Federico
Publisher:
Cham Springer International Publishing AG 2022
Format:
e-book
6.
Image Analysis and Processing - ICIAP 2022 : 21st International Conference, Lecce, Italy, May 23-27, 2022, Proceedings, Part II
Full text!
Author:
Sclaroff, Stan.; Distante, Cosimo; Farinella, Giovanni M.; Leo, Marco; Tombari, Federico
Publisher:
Cham Springer International Publishing AG 2022
Format:
e-book
7.
Pattern Recognition. ICPR International Workshops and Challenges
Full text!
Author:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Publisher:
Springer International Publishing 2021
Format:
e-book
8.
Pattern Recognition. ICPR International Workshops and Challenges
Full text!
Author:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Publisher:
Springer International Publishing 2021
Format:
e-book
9.
Pattern Recognition. ICPR International Workshops and Challenges
Full text!
Author:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Publisher:
Springer International Publishing 2021
Format:
e-book
10.
Pattern Recognition. ICPR International Workshops and Challenges
Full text!
Author:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Publisher:
Springer International Publishing 2021
Format:
e-book
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