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2017
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Confucius Sint-Jorisstraat Brugge
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Sun, Jun
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1.
Automated Technology for Verification and Analysis : 21st International Symposium, ATVA 2023, Singapore, October 24-27, 2023, Proceedings, Part II
Full text!
Author:
André, Étienne.; Sun, Jun
Publisher:
Cham Springer International Publishing AG 2023
Format:
e-book
2.
Automated Technology for Verification and Analysis : 21st International Symposium, ATVA 2023, Singapore, October 24-27, 2023, Proceedings, Part I
Full text!
Author:
André, Étienne.; Sun, Jun
Publisher:
Cham Springer 2023
Format:
e-book
3.
Bioinformatic and Statistical Analysis of Microbiome Data : From Raw Sequences to Advanced Modeling with QIIME 2 and R
Full text!
Author:
Xia, Yinglin.; Sun, Jun
Publisher:
Cham Springer International Publishing AG 2023
Format:
e-book
4.
Mechanisms Underlying Host-Microbiome Interactions in Pathophysiology of Human Diseases
Full text!
Author:
Sun, Jun; Dudeja, Pradeep K.
Publisher:
Springer US 2018
Format:
e-book
5.
Dependable Software Engineering. Theories, Tools, and Applications
Full text!
Author:
Guan; Katoen, Joost-Pieter; Sun, Jun
Publisher:
Springer International Publishing 2019
Format:
e-book
6.
Statistical Analysis of Microbiome Data with R
Full text!
Author:
Xia; Chen, Ding-Geng; Sun, Jun
Publisher:
Springer Singapore 2018
Format:
e-book
7.
FM 2014: Formal Methods
Full text!
Author:
Cliff Jones, Pekka Pihlajasaari, Jun Sun; Pihlajasaari, Pekka; Sun, Jun
Publisher:
Springer International Publishing 2014
Format:
e-book
8.
Inflammation, Infection, and Microbiome in Cancers
Full text!
Author:
Jun Sun
Publisher:
Springer International Publishing 2021
Format:
e-book
9.
Electromagnetic Compatibility : Principles and Applications
Full text!
Author:
Zhao, Yang.; Meng, Zhaojuan; Sun, Jun; Yan, Wei; Zhou, Mengxia
Publisher:
Singapore Springer Singapore Pte. Limited 2021
Format:
e-book
10.
Semantic Technology
Full text!
Author:
Li; Antoniou, Grigoris; Dong, Jin-Song; Hu, Wei; Liu, Yang; Sun, Jun; Wang, Zhe
Publisher:
Springer International Publishing 2016
Format:
e-book
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