Zagatto, Elias Ayres Guidetti; Oliveira, Claudio C.; Townshend, Alan; Worsfold, Paul; Oliveira, Claudio C.; Townshend, Alan; Zagatto, Elias A. G.; Zagatto, Elias Ayres Guidetti; Worsfold, Paul; Zagatto, Elias Ayres Guidetti A. G.
Appleton, Arthur E.; Macrory, Patrick F. J.; Plummer, Michael G.; Appleton, Arthur Edmond; International Trade Law Center; Macrory, Patrick F. J.; Plummer, Michael G.; Appleton, Arthur E.; International Trade Law Center Staff
F. Wittmann, G. Van Zijl; Van Zijl, G.; Wittmann, F.; Wittmann, F.H; International Union of Testing and Research Laboratories for Materials and Structures Staff; RILEM Technical Committee 208-HFC Staff; Wittman, F.H.
Frolov, Ivan E.; Gudkovich, Zalman M.; Karklin, Valery P.; Kovalev, Evgeny G. ; Smolyanitsky, Vasily M.; Frolov, Ivan E.; Gudkovich, Zalman M.; Karklin, Valery P.; Kovalev, Evgeny G.; Smolyanitsky, Vasily M.; Gudkovich, Zalmann M.
Wallisch; Lusignan, Michael E.; Wallisch, Pascal; Adam Seth Dickey; Marc D. Benayoun; Michael E. Lusignan; Nicholas G. Hatsopoulos; Tanya I. Baker; Baker, Tanya I.; Benayoun, Marc D.; Dickey, Adam Seth; Hatsopoulos, Nicholas G.
Parikh, Dakshesh H.; Alexander W. Auldist; Auldist, Alexander W.; Crabbe, David C. G.; David C. G. Crabbe; Parikh, D.H; Parikh, Dakshesh; Rothenberg, Steven S.; Steven S. Rothenberg; Auldist, Alex; Crabbe, David; Rothenberg, Steven