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41. Computer Vision - ECCV 2022 : 17th European Conference, Tel Aviv, Israel, October 23-27, 2022, Proceedings, Part II
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Auteur:
Avidan, Shai.; Brostow, Gabriel; Cissé, Moustapha; Farinella, Giovanni Maria; Hassner, Tal
Uitgever:
Cham Springer 2022
Type:
e-book
42. Computer Vision - ECCV 2022 : 17th European Conference, Tel Aviv, Israel, October 23-27, 2022, Proceedings, Part XXXII
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Auteur:
Avidan, Shai.; Brostow, Gabriel; Cissé, Moustapha; Farinella, Giovanni Maria; Hassner, Tal
Uitgever:
Cham Springer 2022
Type:
e-book
43. Computer Vision - ECCV 2022 : 17th European Conference, Tel Aviv, Israel, October 23-27, 2022, Proceedings, Part III
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Auteur:
Avidan, Shai.; Brostow, Gabriel; Cissé, Moustapha; Farinella, Giovanni Maria; Hassner, Tal
Uitgever:
Cham Springer 2022
Type:
e-book
44. Computer Vision - ECCV 2022 : 17th European Conference, Tel Aviv, Israel, October 23-27, 2022, Proceedings, Part VIII
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Auteur:
Avidan, Shai.; Brostow, Gabriel; Cissé, Moustapha; Farinella, Giovanni Maria; Hassner, Tal
Uitgever:
Cham Springer 2022
Type:
e-book
45. Computer Vision - ECCV 2022 : 17th European Conference, Tel Aviv, Israel, October 23-27, 2022, Proceedings, Part VII
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Auteur:
Avidan, Shai.; Brostow, Gabriel; Cissé, Moustapha; Farinella, Giovanni Maria; Hassner, Tal
Uitgever:
Cham Springer 2022
Type:
e-book
46. Pattern Recognition. ICPR International Workshops and Challenges
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Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
47. Pattern Recognition. ICPR International Workshops and Challenges
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Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
48. Pattern Recognition. ICPR International Workshops and Challenges
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Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
49. Pattern Recognition. ICPR International Workshops and Challenges
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Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
50. Pattern Recognition. ICPR International Workshops and Challenges
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Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book