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51.
Pattern Recognition. ICPR International Workshops and Challenges
Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
52.
Pattern Recognition. ICPR International Workshops and Challenges
Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
53.
Pattern Recognition. ICPR International Workshops and Challenges
Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
54.
Pattern Recognition. ICPR International Workshops and Challenges
Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
55.
Pattern Recognition. ICPR International Workshops and Challenges
Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
56.
Pattern Recognition. ICPR International Workshops and Challenges
Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
57.
Pattern Recognition. ICPR International Workshops and Challenges
Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
58.
Pattern Recognition. ICPR International Workshops and Challenges
Full text!
Auteur:
Alberto Del Bimbo; Bertini, Marco; Cucchiara, Rita; Escalante, Hugo Jair; Farinella, Giovanni Maria; Mei, Tao; Sclaroff, Stan; Vezzani, Roberto
Uitgever:
Springer International Publishing 2021
Type:
e-book
59.
Computer Vision, Imaging and Computer Graphics Theory and Applications: 14th International Joint Conference, VISIGRAPP 2019, Prague, Czech Republic, February 25–27, 2019, Revised Selected Papers
Full text!
Auteur:
Cláudio; Bouatouch, Kadi; Chessa, Manuela; Cláudio, Ana-Paula; Farinella, Giovanni Maria; Hurter, Christophe; Kerren, Andreas; Paljic, Alexis; Tremeau, Alain
Uitgever:
Springer International Publishing 2020
Type:
e-book
60.
Computer Vision, Imaging and Computer Graphics Theory and Applications : 16th International Joint Conference, VISIGRAPP 2021, Virtual Event, February 8-10, 2021, Revised Selected Papers
Full text!
Auteur:
de Sousa, A. Augusto.; Bouatouch, Kadi; Farinella, Giovanni Maria; Havran, Vlastimil; Hurter, Christophe; Paljic, Alexis; Peck, Tabitha; Purchase, Helen; Radeva, Petia
Uitgever:
Cham Springer International Publishing AG 2023
Type:
e-book
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