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1. Artificial Intelligence and Machine Learning: 31st Benelux AI Conference, BNAIC 2019, and 28th Belgian-Dutch Machine Learning Conference, BENELEARN 2019, Brussels, Belgium, November 6–8, 2019, Revised Selected Papers
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Auteur:
Bart Bogaerts; Bontempi, Gianluca; Geurts, Pierre; Harley, Nick; Lebichot, Bertrand; Lenaerts, Tom; Louppe, Gilles
Uitgever:
Springer International Publishing 2020
Type:
e-book
2. Quality and Reliability of Large-Eddy Simulations II
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Auteur:
Maria Vittoria Salvetti, Bernard Geurts, Johan Meyers, Pierre Sagaut; Geurts, Bernard; Meyers, Johan; Sagaut, Pierre; Salvetti, Maria Vittoria
Uitgever:
Springer Netherlands 2011
Type:
e-book
3. Quality and Reliability of Large-Eddy Simulations
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Auteur:
Oliemans, R.V.A; Geurts, Bernard; Geurts, Bernard J.; Meyers, Johan; Rodi, W.; Sagaut, Pierre
Uitgever:
Springer Netherlands 2008
Type:
e-book