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121. Information Systems Development

Auteur:: Pooley, Robert John; Coady, Jennifer; Pooley, Rob; Barry, Chris; Lang, Michael; Linger, Henry; Schneider, Christoph
Uitgever:: Springer New York 2013
Type:: e-book

122. Leading For Educational Lives

Auteur:: Denicolo, Pamela M.; Kompf, Michael; Novak, John M.; Armstrong, Denise; Armstrong, Denise E.; Browne, Brendan
Uitgever:: SensePublishers 2014
Type:: e-book

123. Sustainable e-Business Management

Auteur:: van der Aalst, Will; Mylopoulos, John; Nelson, Matthew L.; Shaw, Michael J.; Strader, Troy J.
Uitgever:: Springer Berlin Heidelberg 2010
Type:: e-book

124. United Arab Emirates Keys to Soil Taxonomy

Auteur:: Shahid, Shabbir A.; Abdelfattah, Mahmoud A.; Chiaretti, Joseph V.; Kelley, John A.; Wilson, Michael A.
Uitgever:: Springer Netherlands 2014
Type:: e-book

125. Cutaneous Melanoma

Auteur:: Balch; Atkins, Michael B.; Garbe, Claus; Gershenwald, Jeffrey E.; Halpern, Allan C.; Kirkwood, John M.; McArthur, Grant A.; Sober, Arthur J.; Thompson, John F.
Uitgever:: Springer International Publishing 2020
Type:: e-book

126. Abstract State Machines, Alloy, B, VDM, and Z

Auteur:: Hutchison, David; Kanade, Takeo; Fitzgerald, John; Gnesi, Stefania; Khurshid, Sarfraz; Leuschel, Michael; Reeves, Steve; Riccobene, Elvinia
Uitgever:: Springer Berlin Heidelberg 2012
Type:: e-book

127. Handbook of Intellectual and Developmental Disabilities

Auteur:: Roberts, Michael C.; Jacobson, John W.; Mulick, James Anton; Peterson, Lizette; Rojahn, Johannes; Mulick, James A.
Uitgever:: Springer US 2007
Type:: e-book

128. Scanning Electron Microscopy and X-Ray Microanalysis

Auteur:: Goldstein; Joy, David C.; Joy, David C.; Michael, Joseph R.; Michael, Joseph R.; Newbury, Dale E.; Newbury, Dale E.; Ritchie, Nicholas W. M.; Ritchie, Nicholas W. M.; Scott, John Henry J.; Scott, John Henry J.
Uitgever:: Springer New York 2018
Type:: e-book

129. Data Engineering

Auteur:: Yupo Chan; Acxiom Laboratory for Applied Research.; Chan, Yupo; Talburt, John R.; Talley, Terry Michael; Acxiom Laboratory for Applied Research Staff; Talburt, John; Talley, Terry M.
Uitgever:: Springer US 2010
Type:: e-book

130. Expert Oracle Application Express

Auteur:: Scott, John Edward; Independent Oracle Users Group.; Gault, Doug; DSouza, Martin; Gielis, Dimitri; Hartman, Roel; Hichwa, Michael; Kennedy, Sharon; Kubicek, Denes; Mattamal, Raj; McGhan, Dan; Scott, John
Uitgever:: Apress 2015
Type:: e-book