Scanning Electron Microscopy and X-Ray Microanalysis

Full text!
Type:
e-book
Titel:
Scanning Electron Microscopy and X-Ray Microanalysis
Auteur:
Goldstein; Joy, David C.; Joy, David C.; Michael, Joseph R.; Michael, Joseph R.; Newbury, Dale E.; Newbury, Dale E.; Ritchie, Nicholas W. M.; Ritchie, Nicholas W. M.; Scott, John Henry J.; Scott, John Henry J.
Taal:
Engels
Uitgever:
Springer New York 2018
ISBN:
1-4939-6674-X
1-4939-6676-6
Permalink:
http://bibtest.howest.be/catalog/ebk03:4340000000223146