Defects in High-k Gate Dielectric Stacks

Full text!
Type:
e-book
Titel:
Defects in High-k Gate Dielectric Stacks
Auteur:
Gusev, Evgeni
Taal:
Engels
Uitgever:
Dordrecht Springer Netherlands 2006
ISBN:
1-4020-4365-1
1-4020-4366-X
9786610461189
1-280-46118-7
1-4020-4367-8
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