Defects in High-k Gate Dielectric Stacks

Format:: e-book
Title:: Defects in High-k Gate Dielectric Stacks
Author:: Gusev, Evgeni
Language:: English
Publisher:: Dordrecht Springer Netherlands 2006
ISBN:: 1-4020-4365-1
1-4020-4366-X
9786610461189
1-280-46118-7
1-4020-4367-8
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