Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Full text!- Type:
- e-book
- Titel:
- Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
- Taal:
- Engels
- Uitgever:
- Springer Berlin Heidelberg 2006
- ISBN:
- 3-540-28405-2
3-642-06663-1
9786610657179
1-280-65717-0
3-540-28472-9 - Permalink:
- http://bibtest.howest.be/catalog/ebk03:1000000000284169
