Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Type:

e-book

Titel:

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Auteur:

Sachdev, Manoj; Pineda de Gyvez, José

Taal:

Engels

Uitgever:

Springer US 2007

ISBN:

0-387-46546-4
1-4419-4285-8
9786610938216
1-280-93821-8
0-387-46547-2

Permalink:

http://bibtest.howest.be/catalog/ebk03:1000000000408404