Digital Noise Monitoring of Defect Origin

Type:: e-book
Titel:: Digital Noise Monitoring of Defect Origin
Auteur:: Aliev, Telman
Taal:: Engels
Uitgever:: Springer US 2007
ISBN:: 0-387-71753-6
1-4419-4410-9
9786611337711
1-281-33771-4
0-387-71754-4
Permalink:: http://bibtest.howest.be/catalog/ebk03:1000000000410970