CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Type:: e-book
Titel:: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Auteur:: Pavlov, Andrei; Sachdev, Manoj
Taal:: Engels
Uitgever:: Springer Netherlands 2008
ISBN:: 1-4020-8362-9
9786611492236
1-281-49223-X
1-4020-8363-7
Permalink:: http://bibtest.howest.be/catalog/ebk03:1000000000440642