CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Format:: e-book
Title:: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Author:: Pavlov, Andrei; Sachdev, Manoj
Language:: English
Publisher:: Springer Netherlands 2008
ISBN:: 1-4020-8362-9
9786611492236
1-281-49223-X
1-4020-8363-7
Permalink:: http://bibtest.howest.be/catalog/ebk03:1000000000440642?locale=en