Thermal Reliability of Power Semiconductor Device in the Renewable Energy System

Type:

e-book

Titel:

Thermal Reliability of Power Semiconductor Device in the Renewable Energy System

Auteur:

Du, Xiong.; Du, Rui; Li, Gaoxian; Qian, Cheng; Yu, Yaoyi; Zhang, Jun

Taal:

Engels

Uitgever:

Singapore Springer 2022

ISBN:

981-19-3131-3
981-19-3132-1

Permalink:

http://bibtest.howest.be/catalog/ebk03:24242645000041