Recent Advances in Metrology : Select Proceedings of Admet 2021

Type:

e-book

Titel:

Recent Advances in Metrology : Select Proceedings of Admet 2021

Auteur:

Yadav, Sanjay.; Arya, Yogendra; Chaudhary, K. P.; Dahiya, Aman; Gahlot, Ajay; Garg, Naveen

Taal:

Engels

Uitgever:

Singapore Springer 2022

ISBN:

981-19-2467-8
981-19-2468-6

Permalink:

http://bibtest.howest.be/catalog/ebk03:24286016100041