IoT System Testing : An IoT Journey from Devices to Analytics and the Edge
Full text!- Type:
- e-book
- Titel:
- IoT System Testing : An IoT Journey from Devices to Analytics and the Edge
- Taal:
- Engels
- Uitgever:
- Berkeley, CA Apress L. P. 2022
- ISBN:
- 1-4842-8275-2
1-4842-8276-0 - Permalink:
- http://bibtest.howest.be/catalog/ebk03:24846071800041
