Reliability of Nanoscale Circuits and Systems

Full text!
Type:
e-book
Titel:
Reliability of Nanoscale Circuits and Systems
Auteur:
Stanisavljevic, Milos; Leblebici, Yusuf; Schmid, Alexandre
Taal:
Engels
Uitgever:
Springer New York 2011
ISBN:
1-4419-6216-6
1-4899-8254-X
9786612972560
1-282-97256-1
1-4419-6217-4
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http://bibtest.howest.be/catalog/ebk03:2550000000019957