Reliability of Nanoscale Circuits and Systems

Format:: e-book
Title:: Reliability of Nanoscale Circuits and Systems
Author:: Stanisavljevic, Milos; Leblebici, Yusuf; Schmid, Alexandre
Language:: English
Publisher:: Springer New York 2011
ISBN:: 1-4419-6216-6
1-4899-8254-X
9786612972560
1-282-97256-1
1-4419-6217-4
Permalink:: http://bibtest.howest.be/catalog/ebk03:2550000000019957?locale=en