Life-Cycle Assessment of Semiconductors

Type:: e-book
Titel:: Life-Cycle Assessment of Semiconductors
Auteur:: Boyd, Sarah B.
Taal:: Engels
Uitgever:: Springer New York 2012
ISBN:: 1-4419-9987-6
1-4899-9223-5
9786613351517
1-283-35151-X
1-4419-9988-4
Permalink:: http://bibtest.howest.be/catalog/ebk03:2550000000056407