Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

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Type:
e-book
Titel:
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Auteur:
Shen, Ruijing; Tan, Sheldon X. -D; Yu, Hao
Taal:
Engels
Uitgever:
Springer US 2012
ISBN:
1-4614-0787-7
1-4899-8787-8
1-4614-0788-5
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