Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Format:: e-book
Title:: Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Author:: Shen, Ruijing; Tan, Sheldon X. -D; Yu, Hao
Language:: English
Publisher:: Springer US 2012
ISBN:: 1-4614-0787-7
1-4899-8787-8
1-4614-0788-5
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