Electromigration Modeling at Circuit Layout Level

Full text!
Type:
e-book
Titel:
Electromigration Modeling at Circuit Layout Level
Auteur:
Tan, Cher Ming; Tan; He, Feifei
Taal:
Engels
Uitgever:
Springer Singapore 2013
ISBN:
981-4451-20-7
981-4451-21-5
Permalink:
http://bibtest.howest.be/catalog/ebk03:2550000001047434