Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Type:: e-book
Titel:: Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Auteur:: Franco, Jacopo; Kaczer, Ben; Groeseneken, Guido
Taal:: Engels
Uitgever:: Springer Netherlands 2014
ISBN:: 94-007-7662-4
94-007-7663-2
Permalink:: http://bibtest.howest.be/catalog/ebk03:2550000001153999