Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Format:: e-book
Title:: Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Author:: Franco, Jacopo; Kaczer, Ben; Groeseneken, Guido
Language:: English
Publisher:: Springer Netherlands 2014
ISBN:: 94-007-7662-4
94-007-7663-2
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