New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices

Format:: e-book
Title:: New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices
Author:: Zalevsky, Zeev; Gur, Eran; Livshits, Pavel
Language:: English
Publisher:: William Andrew Publishing 2014
ISBN:: 0-323-24143-3
1-306-16789-2
0-12-800017-1
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