Analog IC Reliability in Nanometer CMOS

Format:: e-book
Title:: Analog IC Reliability in Nanometer CMOS
Author:: Maricau, Elie; Maricau; Gielen, Georges
Language:: English
Publisher:: Dordrecht Springer New York 2013
ISBN:: 1-4614-6162-6
1-4899-8630-8
1-4614-6163-4
1-299-19739-6
Permalink:: http://bibtest.howest.be/catalog/ebk03:2560000000100047?locale=en