Trace-Based Post-Silicon Validation for VLSI Circuits - bib.howest.be

Trace-Based Post-Silicon Validation for VLSI Circuits

Type:: e-book
Titel:: Trace-Based Post-Silicon Validation for VLSI Circuits
Auteur:: Liu, Xiao; Liu; Xu, Qiang
Taal:: Engels
Uitgever:: Springer International Publishing 2014
ISBN:: 3-319-00532-4
3-319-00533-2
Permalink:: http://bibtest.howest.be/catalog/ebk03:2560000000104421