Trace-Based Post-Silicon Validation for VLSI Circuits

Format:: e-book
Title:: Trace-Based Post-Silicon Validation for VLSI Circuits
Author:: Liu, Xiao; Liu; Xu, Qiang
Language:: English
Publisher:: Springer International Publishing 2014
ISBN:: 3-319-00532-4
3-319-00533-2
Permalink:: http://bibtest.howest.be/catalog/ebk03:2560000000104421?locale=en