VLSI Design and Test : 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers

Type:

e-book

Titel:

VLSI Design and Test : 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers

Auteur:

Shah, Ambika Prasad.; Darji, Anand; Dasgupta, Sudeb; Tudu, Jaynarayan

Taal:

Engels

Uitgever:

Cham Springer 2023

ISBN:

3-031-21513-3
3-031-21514-1

Permalink:

http://bibtest.howest.be/catalog/ebk03:25732563600041