Built-In Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design : A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

Type:

e-book

Titel:

Built-In Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design : A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

Auteur:

Li, Xiaowei.; Liu, Cheng; Yan, Guihai

Taal:

Engels

Uitgever:

Singapore Springer 2023

ISBN:

981-19-8550-2
981-19-8551-0

Permalink:

http://bibtest.howest.be/catalog/ebk03:26189276000041